Advances in Imaging and Electron Physics 112
Peter W. Hawkes (Eds.)
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Kategorie:
Rok:
2000
Wydanie:
1
Wydawnictwo:
Elsevier, Academic Press
Język:
english
Strony:
1
ISBN 10:
0120147548
ISBN 13:
9780120147540
Serie:
Advances in Imaging and Electron Physics 112
Plik:
PDF, 3.52 MB
IPFS:
,
english, 2000